The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2016
Filed:
Mar. 08, 2013
Applicant:
Smart Storage Systems, Inc., Chandler, AZ (US);
Inventors:
David Lee Dean, Litchfield Park, AZ (US);
Robert W. Ellis, Phoenix, AZ (US);
Scott Harrow, Scottsdale, AZ (US);
Assignee:
SANDISK TECHNOLOGIES LLC, Plano, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/10 (2006.01); G01R 1/44 (2006.01); G01R 3/00 (2006.01); G01R 31/28 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 1/44 (2013.01); G01R 3/00 (2013.01); G01R 31/2874 (2013.01); G01R 1/0458 (2013.01); Y10T 29/49117 (2015.01);
Abstract
A test system, and a method of manufacture thereof, including: a thermal management head including a heat spreader; an electronic device in direct contact with the heat spreader; and an electrical current for transferring energy between the heat spreader and the electronic device.
Quick Actions:
Dean, David. (2016). Test system with localized heating and method of manufacture thereof (U.S. Patent No. 9470720). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9470720
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