The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2016

Filed:

Sep. 09, 2013
Applicant:

Asm America, Inc., Phoenix, AZ (US);

Inventors:

Robert B. Milligan, Gold Canyon, AZ (US);

Dong Li, Phoenix, AZ (US);

Steven Marcus, Tempe, AZ (US);

Assignee:

ASM AMERICA, INC., Phoenix, AZ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/48 (2006.01); H01L 23/52 (2006.01); H01L 29/40 (2006.01); H01L 23/00 (2006.01); C23C 16/32 (2006.01); C23C 16/36 (2006.01); C23C 16/455 (2006.01); H01L 21/28 (2006.01); H01L 29/49 (2006.01); H01L 29/51 (2006.01);
U.S. Cl.
CPC ...
H01L 23/562 (2013.01); C23C 16/32 (2013.01); C23C 16/36 (2013.01); C23C 16/45542 (2013.01); H01L 21/28088 (2013.01); H01L 29/4966 (2013.01); H01L 29/517 (2013.01); H01L 2924/0002 (2013.01);
Abstract

Methods of forming a conductive metal layer over a dielectric layer using plasma enhanced atomic layer deposition (PEALD) are provided, along with related compositions and structures. A plasma barrier layer is deposited over the dielectric layer by a non-plasma atomic layer deposition (ALD) process prior to depositing the conductive layer by PEALD. The plasma barrier layer reduces or prevents deleterious effects of the plasma reactant in the PEALD process on the dielectric layer and can enhance adhesion. The same metal reactant can be used in both the non-plasma ALD process and the PEALD process.


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