The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Jan. 29, 2013
Advantest Corporation, Tokyo, JP;
The University of Tokyo, Tokyo, JP;
Takahiro Yamaguchi, Saitama, JP;
Satoshi Komatsu, Tokyo, JP;
Kunihiro Asada, Tokyo, JP;
James Sumit Tandon, Tokyo, JP;
ADVANTEST CORPORATION, Tokyo, JP;
THE UNIVERSITY OF TOKYO, Tokyo, JP;
Abstract
Provided is a detection apparatus that detects process variation in a plurality of comparators that each output a comparison result obtained by comparing a signal level of an input signal to a reference level, the detection apparatus comprising a signal input section that inputs the input signal and the reference level in common to the comparators, and sequentially changes the signal level of the input signal; and a detecting section that detects, for each signal level, a number of comparison results that indicate a predetermined result, from among the comparison results of the comparators, and detects the process variation based on a distribution of the number of comparison results that indicate the predetermined result.