The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Mar. 10, 2015
Mpi Corporation, Chu-Pei, Hsinchu Shien, TW;
Tsung-Yi Chen, Chu-Pei, TW;
Horng-Kuang Fan, Chu-Pei, TW;
Ching-Hung Yang, Chu-Pei, TW;
Chung-Tse Lee, Chu-Pei, TW;
Chia-Yuan Kuo, Chu-Pei, TW;
Tien-Chia Li, Chu-Pei, TW;
Ting-Ju Wu, Chu-Pei, TW;
MPI CORPORATION, Chu-Pei, Hsinchu Shien, TW;
Abstract
An assembling method for a vertical probe device includes steps of disposing a lower die on a jig by inserting supporting columns through jig holes of the lower die, fastening a positioning film on the supporting columns, installing probe needles and an upper die in a way that the positioning film is located between the upper and lower dies without contacting the upper die, unfastening the positioning film, and removing the jig so that the upper and lower dies, positioning film and probe needles constitute the device. A maintaining method for the device includes steps of inserting the supporting columns through the jig holes, fastening the positioning film to the jig, and removing the upper die. The probe needles and upper die are easily removed and installed and the probe needles are reliable. The vertical probe device is applicable for accommodating electronic components on the top thereof.