The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Jul. 24, 2014
Carl Zeiss Microscopy Gmbh, Jena, DE;
Ruprecht-karls-universitaet-heidelberg, Heidelberg, DE;
Martin Edelmann, Aalen, DE;
Alexandra F. Elli, Oberkochen, DE;
Andreas Schertel, Aalen, DE;
Rasmus Schroeder, Heidelberg, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Ruprecht-Karls-Universitaet-Heidelberg, Heidelberg, DE;
Abstract
Methods and devices for magnified imaging of three-dimensional samples are disclosed. The methods include imaging sample sections of a sample section series using a first particle-optical device. Coordinates of the imaged sample point are acquired and stored in such a way that the coordinates of the imaged sample point can be associated with the respective image of this sample point. The method also includes selecting a volume of interest (VOI), and transmitting the coordinates of the selected VOI to a second particle-optical device. In addition, the method includes imaging the selected VOI by means of the second particle-optical device. A plurality of planes of a sample section are imaged in order to obtain a 3D image of the selected VOI.