The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2016

Filed:

Sep. 11, 2013
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Ryoji Asakura, Tokyo, JP;

Akira Kagoshima, Tokyo, JP;

Daisuke Shiraishi, Tokyo, JP;

Kenji Tamaki, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); G01J 3/443 (2006.01); G01N 21/68 (2006.01);
U.S. Cl.
CPC ...
G01J 3/443 (2013.01); G01N 21/68 (2013.01); H01J 37/32972 (2013.01); H01J 2237/334 (2013.01);
Abstract

An etching apparatus calculates an emission intensity in the vicinity of each of a plurality of wavelengths, at which a specified element should emit light, from information indicating light emission measured by an optical emission spectroscope during etching processing and, if it is determined that the calculated emission intensity information and emission intensity information stored in a storage unit are similar, extracts a wavelength, corresponding to the calculated emission intensity, with the wavelength associated with the element.


Find Patent Forward Citations

Loading…