The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2016

Filed:

Dec. 20, 2013
Applicant:

Rudolph Technologies, Inc., Flanders, NJ (US);

Inventors:

Isao Sato, Tokyo, JP;

Hiroki Ueno, Tokyo, JP;

Yasutoshi Ito, Kumamoto-ken, JP;

Masataka Ryu, Kangawa-ken, JP;

Troy Palm, Eden Prairie, MN (US);

Assignee:

Rudolph Technologies, Inc., Wilmington, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/687 (2006.01); B25J 11/00 (2006.01); H01L 21/67 (2006.01); B25J 15/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/68707 (2013.01); B25J 11/0095 (2013.01); B25J 15/0014 (2013.01); H01L 21/67259 (2013.01);
Abstract

A mechanism for handling substrates such as semiconductor wafers is disclosed. The mechanism supports the substrate in a tilted orientation to ensure that undesirable contact between a bowed substrate and the mechanism does not occur. The structure that supports the substrate in a tilted orientation may be fixed or adjustable. A sensor may be provided to measure and/or monitor a distance between a substrate and the mechanism. Alternatively, a sensor for determining contact between the substrate and the mechanism may be provided.


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