The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2016
Filed:
Jan. 24, 2013
Applicant:
Ltx-credence Corporation, Norwood, MA (US);
Inventors:
William A. Fritzsche, Morgan Hill, CA (US);
James Michael Jula, Portland, OR (US);
Timothy Alton, Gilroy, CA (US);
Russell Elliott Poffenberger, Discovery Bay, CA (US);
Michael E. Amy, Danville, CA (US);
Assignee:
Xcerra Corporation, Norwood, MA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/273 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/273 (2013.01); G06F 11/2294 (2013.01); G06F 11/2733 (2013.01);
Abstract
A segmented subsystem, for use within an automated test platform, includes a first subsystem segment including a first data sequencer configured to coordinate the execution of one or more instructions within the first subsystem segment. A second subsystem segment includes a second data sequencer configured to coordinate the execution of one or more instructions within the second subsystem segment.