The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2016

Filed:

Mar. 31, 2014
Applicant:

Hitachi High-technologies Corporation, Minato-ku, Tokyo, JP;

Inventors:

Takeshi Yogi, Tokyo, JP;

Sakuichiro Adachi, Tokyo, JP;

Hajime Yamazaki, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/49 (2006.01); G01N 35/02 (2006.01); G01N 35/10 (2006.01); G01N 21/25 (2006.01); G01N 21/51 (2006.01); G01N 21/82 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/025 (2013.01); G01N 21/253 (2013.01); G01N 21/49 (2013.01); G01N 21/51 (2013.01); G01N 21/82 (2013.01); G01N 35/1002 (2013.01); G01N 2021/825 (2013.01); G01N 2035/0439 (2013.01); G01N 2201/061 (2013.01); G01N 2201/12 (2013.01);
Abstract

To reduce the influence of air bubbles and dust in measuring scattered light beams on an automatic analyzer. A light source emits a light beam with a first wavelengthon a shorter wavelength side and a light beam with a second wavelengthon a longer wavelength side, and then, transmitted light beamsandand scattered light beamsandare received. Noise is estimated from the ratio between the intensities of the transmitted light beams with the first wavelength and the second wavelength and a change in the amount of the scattered light beam with the second wavelength. Then, the estimated noise is subtracted from a change in the amount of the scattered light beam with the first wavelength, so that noise due to air bubbles and dust is reduced.


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