The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2016

Filed:

Jul. 24, 2013
Applicant:

Siltronic Ag, Munich, DE;

Inventors:

Timo Mueller, Burghausen, DE;

Gudrun Kissinger, Lebus, DE;

Dawid Kot, Kunice, DE;

Andreas Sattler, Trostberg, DE;

Assignee:

Siltronic AG, Munich, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 15/14 (2006.01); C30B 33/02 (2006.01); C30B 29/06 (2006.01); C30B 15/00 (2006.01); H01L 21/322 (2006.01); C30B 15/20 (2006.01); C30B 15/04 (2006.01); H01L 29/04 (2006.01); H01L 29/16 (2006.01);
U.S. Cl.
CPC ...
C30B 33/02 (2013.01); C30B 15/00 (2013.01); C30B 15/04 (2013.01); C30B 15/14 (2013.01); C30B 15/203 (2013.01); C30B 29/06 (2013.01); H01L 21/3225 (2013.01); H01L 29/04 (2013.01); H01L 29/16 (2013.01); Y10T 428/24975 (2015.01);
Abstract

The invention relates to a semiconductor wafer of monocrystalline silicon, and to a method for producing it. The semiconductor wafer has a zone, DZ, which is free of BMD defects and extends from a front side of the semiconductor wafer into the bulk of the semiconductor wafer, and a region having BMD defects which extends from the DZ further into the bulk of the semiconductor wafer. A silicon single crystal is pulled by the Czochralski method and processed to form a polished monocrystalline silicon substrate wafer. The substrate wafer is treated by rapidly heating and cooling the substrate wafer, slowly heating the rapidly heated and cooled substrate wafer, and keeping the substrate wafer at a specific temperature and over a specific period.


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