The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2016

Filed:

Jul. 09, 2015
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Ming-Chieh Huang, San Jose, CA (US);

Jing Jing Chen, Los Angeles, CA (US);

Chan-Hong Chern, Palo Alto, CA (US);

Tao Wen Chung, San Jose, CA (US);

Chih-Chang Lin, San Jose, CA (US);

Yuwen Swei, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/03 (2006.01);
U.S. Cl.
CPC ...
H04L 25/03057 (2013.01); H04L 2025/0349 (2013.01); H04L 2025/03566 (2013.01); H04L 2025/03617 (2013.01); H04L 2025/03687 (2013.01);
Abstract

An apparatus includes a plurality of delay elements configured to delay a respective input signal and to output a respective delayed signal. The apparatus also includes a weight generator configured to generate a plurality of tap weights based on the delayed signals. The apparatus further includes a tap controller configured to generate tap weight enabling signals corresponding to one or more of the tap weights if the corresponding tap weights are greater than a predetermined threshold value. The tap controller is also configured to generate a set of bias factors based on corresponding tap weights of the plurality of tap weights.


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