The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2016

Filed:

Nov. 27, 2014
Applicant:

Chi Mei Corporation, Tainan, TW;

Inventors:

Chi-Ming Liu, Kaohsiung, TW;

Chun-An Shih, Tainan, TW;

Assignee:

Chi Mei Corporation, Tainan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/023 (2006.01); G03F 7/40 (2006.01); G03F 7/039 (2006.01); G03F 7/038 (2006.01);
U.S. Cl.
CPC ...
G03F 7/0233 (2013.01); G03F 7/0236 (2013.01); G03F 7/038 (2013.01); G03F 7/039 (2013.01); G03F 7/0388 (2013.01); G03F 7/40 (2013.01);
Abstract

A positive photosensitive resin composition, a pattern forming method, a thin film transistor array substrate, and a liquid crystal display device are provided. The positive photosensitive resin includes a novolac resin (A), an alkali-soluble resin (B), an ester (C) of an o-naphthoquinone diazide sulfonic acid, and a solvent (D). The alkali-soluble resin (B) includes a first alkali-soluble resin (B-1) produced by polymerizing a mixture. The mixture includes an epoxy compound (i) and a compound (ii), wherein the epoxy compound (i) has at least two epoxy groups, and the compound (ii) has at least one carboxylic acid group and at least one ethylenically unsaturated group.


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