The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2016
Filed:
Apr. 11, 2012
Henry Arnold, Yorba Linda, CA (US);
Brian Buras, Austin, TX (US);
Pierre Gauthier, Candiac, CA;
James Stephen Ledford, Birmingham, AL (US);
Henry Arnold, Yorba Linda, CA (US);
Brian Buras, Austin, TX (US);
Pierre Gauthier, Candiac, CA;
James Stephen Ledford, Birmingham, AL (US);
ADVANTEST CORPORATION, Tokyo, JP;
Abstract
A method of testing a device. The method comprises determining a computational window. The computational window is a time period of device testing activity below an activity threshold. The at least one computational window occurs during the device testing activity. The method further comprises creating and executing a decision tree during the computational window. The decision tree comprises a scheduled test analysis of test results and a selection of test control actions scheduled to execute in response to the test analysis.