The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2016
Filed:
Aug. 28, 2013
Applicant:
Kabushiki Kaisha Toshiba, Minato-ku, Tokyo, JP;
Inventors:
Kentaro Kobayashi, Tokyo, JP;
Hideto Furuyama, Yokohama, JP;
Assignee:
KABUSHIKI KAISHA TOSHIBA, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/14 (2006.01); G01N 15/06 (2006.01); G01N 33/487 (2006.01); B01L 3/00 (2006.01); G01N 15/00 (2006.01); G01N 27/447 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0606 (2013.01); B01L 3/502707 (2013.01); B01L 3/502753 (2013.01); G01N 15/0656 (2013.01); G01N 33/48721 (2013.01); B01L 2300/0681 (2013.01); B01L 2400/0421 (2013.01); B01L 2400/086 (2013.01); G01N 27/44791 (2013.01); G01N 2015/0065 (2013.01);
Abstract
According to one embodiment, a semiconductor analysis microchip configured to detect a fine particle in a sample liquid, including a semiconductor substrate, a first flow channel provided in the semiconductor substrate, to which the sample liquid is introduced, and a pore provided in the first flow channel and configured to pass the fine particle in the sample liquid.