The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2016

Filed:

Jun. 26, 2012
Applicants:

Jessica Gullbrand, Forest Grove, OR (US);

Karthik Sankaranarayanan, Cumberland, RI (US);

Willem M. Beltman, West Linn, OR (US);

Eric Baugh, Portland, OR (US);

Stephen H. Gunther, Beaverton, OR (US);

Jay D. Schwartz, Aloha, OR (US);

Inventors:

Jessica Gullbrand, Forest Grove, OR (US);

Karthik Sankaranarayanan, Cumberland, RI (US);

Willem M. Beltman, West Linn, OR (US);

Eric Baugh, Portland, OR (US);

Stephen H. Gunther, Beaverton, OR (US);

Jay D. Schwartz, Aloha, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/26 (2006.01); H02M 1/44 (2007.01); H02M 1/36 (2007.01); G06F 1/32 (2006.01);
U.S. Cl.
CPC ...
H02M 1/44 (2013.01); H02M 1/36 (2013.01); G06F 1/3203 (2013.01);
Abstract

In one or more embodiments, a fixed time interval for a system is determined. The fixed time interval corresponds to time between clock ticks. A random time interval is determined based on the fixed time interval and an offset. One or more electronic components affixed to a motherboard are transitioned to a new power state when the random time interval has elapsed. By introducing a randomization to the timing element to a control signal that drives the power state transition, a periodicity for the system is disrupted. The disruption in periodicity mitigates acoustic noise generated by vibrations in electronic components and motherboards affected by current and/or voltage transitions.


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