The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2016

Filed:

Jun. 04, 2015
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Feng Pan, Fremont, CA (US);

Shigekazu Yamada, Tokyo, JP;

Allahyar Vahidimowlavi, San Jose, CA (US);

Jae-Kwan Park, Cupertino, CA (US);

Cairong Hu, San Jose, CA (US);

Kalyan Kavalipurapu, Santa Clara, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/02 (2006.01); G11C 29/50 (2006.01); G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
G11C 29/025 (2013.01); G01R 31/025 (2013.01); G11C 29/50 (2013.01); G11C 2029/5006 (2013.01);
Abstract

A system includes a first switch, an amplifier, a second switch, and a capacitor. The first switch is electrically coupled between a first reference voltage and a node. The amplifier has a first input, a second input, and an output, the amplifier to receive a second reference voltage on the first input and a sample voltage on the second input. The second switch is electrically coupled between the output of the amplifier and the second input of the amplifier. The capacitor is electrically coupled between the second input of the amplifier and the node. The first switch and the second switch are closed to initialize the node to the first reference voltage and to initialize the amplifier in unity-gain configuration. The first switch and the second switch are opened to detect a leakage current by sensing a change in the sample voltage.


Find Patent Forward Citations

Pan, Feng. (2016). Leakage current detection (U.S. Patent No. 9443610). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9443610

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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