The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2016

Filed:

Jun. 29, 2012
Applicants:

Benjamin A. Ward, Portland, OR (US);

Kenneth P. Dobyns, Beaverton, OR (US);

Gary J. Waldo, Hillsboro, OR (US);

Inventors:

Benjamin A. Ward, Portland, OR (US);

Kenneth P. Dobyns, Beaverton, OR (US);

Gary J. Waldo, Hillsboro, OR (US);

Assignee:

TEKTRONIX, INC., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/00 (2006.01); G09G 5/10 (2006.01); G09G 5/00 (2006.01);
U.S. Cl.
CPC ...
G09G 5/10 (2013.01); G09G 5/00 (2013.01); G09G 2320/0271 (2013.01);
Abstract

Disclosed is a test and measurement instrument that includes a signal input structured to receive a modulated radio frequency (RF) signal under test and a demodulator structured to extract a digital signal from the received modulated RF signal. The extracted digital signal has a measurable parameter. The instrument also includes a display controller structured to display the extracted demodulated signal at one of at least two different intensities based on the measured parameter of the digital signal. In other embodiments the signal need not be an RF signal. Methods of operation are also described.


Find Patent Forward Citations

Loading…