The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2016
Filed:
Nov. 04, 2011
Masato Ishizawa, Hitachinaka, JP;
Yoshiyuki Shoji, Mito, JP;
Minoru Sano, Hitachinaka, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
A genetic testing method and an apparatus therefor are provided, in which temperatures of a plurality of reaction tubes are independently controlled using a thermostat, a temperature detecting device, and a heating and cooling device provided on each of the reaction tubes, the reaction tubes each accommodate an amplification liquid and a component necessary for amplification, temperature is controlled at individual positions to hold the reaction tubes and at a predetermined temperature set at the individual positions according to an analysis and testing protocol predetermined at individual positions of the reaction tubes, a controlled temperature value is monitored in a reaction tube unit and a corrected value of controlled temperature is computed and stored on a reaction tube unit, a temperature of the reaction tube is controlled based on the computed value, and light emission of the amplification liquid accommodated in the reaction tube is measured.