The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Jan. 23, 2015
Applicant:

Samsung Electronics Co., Ltd., Suwon-Si, Gyeonggi-Do, KR;

Inventors:

Jeong-ju Park, Hwaseong-si, KR;

Hyoung-hee Kim, Hwaseong-si, KR;

Kyoung-mi Kim, Anyang-si, KR;

Se-kyung Baek, Hwaseong-si, KR;

Soo-jin Lee, Anyang-si, KR;

Jae-ho Kim, Yongin-si, KR;

Jung-sik Choi, Seongnam-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/311 (2006.01); H01L 21/3105 (2006.01); H01L 21/027 (2006.01); H01L 21/033 (2006.01); H01L 21/308 (2006.01); H01L 21/3213 (2006.01); G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/31144 (2013.01); G03F 7/0002 (2013.01); H01L 21/0273 (2013.01); H01L 21/0337 (2013.01); H01L 21/3086 (2013.01); H01L 21/31058 (2013.01); H01L 21/32139 (2013.01);
Abstract

A method of forming a fine pattern includes forming a phase separation guide layer on a substrate, forming a neutral layer on the phase separation guide layer, forming a first pattern including first openings on the neutral layer, forming a second pattern including second openings each having a smaller width than each of the first openings, forming a neutral pattern including guide patterns exposing a portion of the phase separation guide layer by etching an exposed portion of the neutral layer by using the second pattern as an etch mask, removing the second pattern to expose a top surface of the neutral pattern, forming a material layer including a block copolymer on the neutral pattern and the phase separation guide layer exposed through the guide patterns, and forming a fine pattern layer including a first block and a second block on the neutral pattern and the phase separation guide layer.


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