The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Jun. 25, 2015
Applicant:

Macronix International Co., Ltd., Hsin-Chu, TW;

Inventors:

Atsuhiro Suzuki, Hsinchu, TW;

Ya Jui Lee, Taichung, TW;

Kuan Fu Chen, Taipei, TW;

Chih-Wei Lee, New Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01); G11C 16/34 (2006.01); G11C 16/10 (2006.01); G11C 11/56 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3427 (2013.01); G11C 11/5628 (2013.01); G11C 16/10 (2013.01);
Abstract

Provided are methods, devices, and/or the like for reducing the bit line interference when programming non-volatile memory. One method comprises providing a non-volatile memory device comprising a set of cells, each cell associated with a bit line; shooting a programming voltage across each cell; detecting a threshold voltage for each cell; identifying a fast subset of the set of cells and a slow subset of the set of cells based at least in part on the detected threshold voltage for each cell; and shooting the programming voltage until the threshold voltage for each cell is greater than a verify voltage. For each shot a fast bit line bias is applied to the bit line associated each cell of the fast subset and a slow bit line bias is applied to the bit line associated with each cell of the slow subset.


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