The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Mar. 24, 2014
Applicant:

Vutara, Inc., Park City, UT (US);

Inventor:

Stan Kanarowski, Park City, UT (US);

Assignee:

Bruker Nano, Inc., Billerica, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 15/00 (2006.01); H04N 5/77 (2006.01); G02B 21/36 (2006.01); G01N 21/64 (2006.01); G02B 21/16 (2006.01); G02B 27/10 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G01N 21/64 (2013.01); G01N 21/6458 (2013.01); G02B 21/16 (2013.01); G02B 27/1066 (2013.01);
Abstract

A system and method for creating three dimensional images using probe molecules is disclosed and described. A sample is mounted on a stage. The sample has a plurality of probe molecules. The sample is illuminated with light, causing the probe molecules to luminesce. The probe luminescence can be split into at least four paths corresponding to at least four detection planes corresponding to object planes in the sample. The at least four detection planes are detected linearly via an sCMOS camera. Object planes in corresponding recorded regions of interest are recorded in the camera. A signal from the regions of interest is combined into a three dimensional image.


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