The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2016
Filed:
May. 27, 2011
Applicants:
W Scott Villareal Filler, Santa Clara, CA (US);
Ahmed S. Tantawy, San Jose, CA (US);
Erik H. Volkerink, Palo Alto, CA (US);
Inventors:
W Scott Villareal Filler, Santa Clara, CA (US);
Ahmed S. Tantawy, San Jose, CA (US);
Erik H. Volkerink, Palo Alto, CA (US);
Assignee:
ADVANTEST CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/263 (2006.01); G06F 17/00 (2006.01); G11C 29/56 (2006.01); G01R 31/28 (2006.01); G01R 31/319 (2006.01); G06F 11/273 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31908 (2013.01); G01R 31/2834 (2013.01); G06F 11/263 (2013.01); G06F 11/2733 (2013.01); G06F 17/00 (2013.01); G11C 29/56 (2013.01);
Abstract
A system for use in automated test equipment. In one embodiment, the system includes a configurable integrated circuit (IC) programmed to provide test patterns and an interface to at least one device under test (DUT). The system also includes a connection to the at least one DUT, wherein the connection is coupled directly between the configurable IC and the at least one DUT.