The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2016
Filed:
Jun. 20, 2012
Wojciech Jakub Poppe, San Jose, CA (US);
Ilyas Elkin, Sunnyvale, CA (US);
Puneet Gupta, San Jose, CA (US);
Wojciech Jakub Poppe, San Jose, CA (US);
Ilyas Elkin, Sunnyvale, CA (US);
Puneet Gupta, San Jose, CA (US);
NVIDIA CORPORATION, Santa Clara, CA (US);
Abstract
The described systems and methods can facilitate examination of device parameters including analysis of relatively dominant characteristic impacts on delays. In one embodiment, at least some coupling components (e.g., metal layer wires, traces, lines, etc.) have a relatively dominant impact on delays and the delay is in part a function of both capacitance and resistance of the coupling component. In one embodiment, a system comprises a plurality of dominant characteristic oscillating rings, wherein each respective one of the plurality of dominant characteristic oscillating rings includes a respective dominant characteristic. Additional analysis can be performed correlating the dominant characteristic delay impact results with device fabrication and operation.