The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2016

Filed:

Mar. 23, 2015
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Toru Tanzawa, Tokyo, JP;

Akira Goda, Boise, ID (US);

Shigekazu Yamada, Tokyo, JP;

Hiroyuki Sanda, Palo Alto, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 16/10 (2006.01); G11C 16/26 (2006.01); G11C 16/08 (2006.01);
U.S. Cl.
CPC ...
G11C 16/10 (2013.01); G11C 16/08 (2013.01); G11C 16/26 (2013.01); G11C 16/0483 (2013.01);
Abstract

Embodiments of the present disclosure are directed towards techniques and configurations for providing an apparatus comprising a memory array, to which bias voltage may be provided to reduce leakage current. In one embodiment, the apparatus may comprise a three-dimensional (3D) memory array having at least first and second blocks; and circuitry coupled with the 3D memory array to access the 3D memory array. The circuitry may include circuit to deselect the first block and select the second block, and supply a first bias voltage to the deselected first block and a second bias voltage to the selected second block, to reduce leakage current in the 3D memory array. The first bias voltage may be different than the second bias voltage. Other embodiments may be described and/or claimed.


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