The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2016
Filed:
Jan. 02, 2013
Test Research, Inc., Taipei, TW;
Test Research, Inc., Taipei, TW;
Abstract
A three-dimensional measurement system includes a measurement platform, a projection module, an image-capturing module, and a control unit. The measurement platform carries a test object. The projection module includes a light-emitting unit, a light-shielding rotary disc, a grating unit, and an optical-reflective ring structure. The light-emitting unit generates a light beam. An aperture formed in the light-shielding rotary disc is located at different rotational positions time-sequentially while the light-shielding rotary disc rotates, and the light beam passes through the aperture to form light beam segments. The grating unit transforms the light beam segments into stripe-patterned structure-light beams. The optical-reflective ring structure reflects the stripe-patterned structure-light beams onto the test object. The image-capturing module captures stripe-patterned images formed after reflection of the stripe-patterned structure-light beams from the test object. The control unit measures a three-dimensional shape of the test object using the stripe-patterned images.