The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2016

Filed:

Oct. 04, 2010
Applicants:

Kuang-pu Wen, Taipei, TW;

Don Lin, Taipei, TW;

Liang-pin Yu, Taipei, TW;

Inventors:

Kuang-Pu Wen, Taipei, TW;

Don Lin, Taipei, TW;

Liang-Pin Yu, Taipei, TW;

Assignee:

Test Research, Inc., Taipei, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
H04N 7/18 (2013.01); G01B 11/2518 (2013.01);
Abstract

A measuring system for a 3D object includes a base, a horizontal scanning device disposed on the base, a first light emitting device, a second light emitting device, an image capture device, and a control device. The first light emitting device, the second light emitting device, and the image capture device are connected to the horizontal scanning device. The control device controls the horizontal scanning device to cause planar motion relative to the base. With the control of the control device, the first light emitting device and the second light emitting device alternate in projecting a light source onto a 3D object. The image capture device includes a double-sided telecentric lens to capture a plurality of images of the 3D object when the light source is projected onto the 3D object.


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