The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Mar. 14, 2013
Mitutoyo Corporation, Kanagawa, JP;
Fumihiro Takemura, Brussels, BE;
Fumihiko Koshimizu, Zama, JP;
MITUTOYO CORPORATION, Kanagawa, JP;
Abstract
A hardness tester capable of facilitating positioning of a sample even when the hardness tester includes a manual XY stage. The hardness tester includes an XY stage displacing a sample stage in a horizontal direction; a CCD camera capturing an image of a sample surface via an objective lens; a monitor displaying the image of the sample surface captured by the CCD camera; an operator specifying a test position at which an indentation is to be formed, the test position being specified on the image displayed on the display; and a CPU calculating, in conjunction with displacement of the XY stage, an amount of offset in the XY direction between the test position and a center position of the indenter when forming the indentation, then displaying the calculated amount of offset on the display.