The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2016

Filed:

Oct. 05, 2015
Applicant:

Hitachi Kokusai Electric Inc., Tokyo, JP;

Inventors:

Tatsuyuki Saito, Toyama, JP;

Masanori Sakai, Takaoka, JP;

Yukinao Kaga, Toyama, JP;

Takashi Yokogawa, Tonami, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/314 (2006.01); C23C 16/44 (2006.01); C23C 16/455 (2006.01); H01L 21/02 (2006.01); H01L 21/285 (2006.01); C23C 16/52 (2006.01); C23C 16/34 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
C23C 16/4408 (2013.01); C23C 16/34 (2013.01); C23C 16/4412 (2013.01); C23C 16/45534 (2013.01); C23C 16/45544 (2013.01); C23C 16/52 (2013.01); H01L 21/0228 (2013.01); H01L 21/02186 (2013.01); H01L 21/02274 (2013.01); H01L 21/28562 (2013.01); H01L 21/3141 (2013.01); H01L 21/76841 (2013.01);
Abstract

Provided is a semiconductor device manufacturing method of forming a film of less than one atomic layer on a substrate. The method includes (a) supplying a source gas into a processing chamber accommodating the substrate to adsorb the source gas on the substrate; (b) supplying a reactive gas different from the source gas into the processing chamber to cause a reaction of the reactive gas with the source gas adsorbed on the substrate before the source gas is saturatively adsorbed on the substrate; (c) removing an inner atmosphere of the processing chamber; and (d) supplying a modifying gas into the processing chamber to modify the source gas adsorbed on the substrate.


Find Patent Forward Citations

Loading…