The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
Feb. 14, 2014
Universiteit Antwerpen, Antwerpen, BE;
Fei Company, Hillsboro, OR (US);
Dirk Van Dyck, Aartselaar, BE;
Uwe Lucken, Suedbrookmerland, DE;
Holger Stark, Waake, DE;
Sara Bals, Antwerpen, BE;
UNIVERSITEIT ANTWERPEN, Antwerpen, BE;
FEI COMPANY, Hillsboro, OR (US);
Abstract
A method for performing high resolution electron microscopy of a soft matter object is described. The method comprises irradiating a soft matter object using an electron microscope having a spherical aberration correction with a substantially constant transfer function in a frequency band of thermal diffuse scattered electrons scattered at the soft matter object. The method comprises detecting the thermal diffuse scattered (TDS) electrons scattered at the soft matter, and using the detected thermal diffuse scattered electrons for deriving therefrom an image of the soft matter object.