The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
Sep. 22, 2014
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Robert L. Farrell, Granite Bay, CA (US);
Prasoonkumar Surti, Folsom, CA (US);
Vasanth Ranganathan, El Dorado Hills, CA (US);
Karol A. Szerszen, Rancho Cordova, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/40 (2011.01); G06T 5/00 (2006.01); G06T 9/00 (2006.01);
U.S. Cl.
CPC ...
G06T 15/405 (2013.01); G06T 5/002 (2013.01); G06T 9/00 (2013.01);
Abstract
By packing the depth data in a way that is independent of the number of samples, so that memory bandwidth is the same regardless of the number of samples, higher numbers of samples per pixel may be used without adversely affecting buffer cost. In some embodiments, the number of pixels per clock in a first level depth test may be increased by operating in the pixel domain, whereas previous solutions operated at the sample level.