The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2016

Filed:

Mar. 21, 2014
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventors:

Sushovan Podder, Bangalore, IN;

Parthajit Bhattacharya, Bangalore, IN;

Rohit Kapur, Cupertino, CA (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 11/00 (2006.01); G01R 31/3185 (2006.01); G01R 31/3183 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318547 (2013.01); G01R 31/31835 (2013.01);
Abstract

A method for reordering a test pattern set for testing an integrated circuit is disclosed. A productivity index is computed for each test pattern in a test pattern set. The productivity index of a first test pattern and the productivity index of a second test pattern are compared. If the productivity index of the second test pattern is larger than the productivity index of the first test pattern, the location of the first test pattern and the second test pattern are swapped.


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