The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
May. 18, 2007
Applicants:
Steven Selwyn Staal, Enschede, NL;
Jan Floris, Enschede, NL;
Marko Blom, Enschede, NL;
Johannes Oonk, Enschede, NL;
Inventors:
Steven Selwyn Staal, Enschede, NL;
Jan Floris, Enschede, NL;
Marko Blom, Enschede, NL;
Johannes Oonk, Enschede, NL;
Assignee:
CE-MATE B.V., Enschede, NL;
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/447 (2006.01); H01R 24/00 (2011.01); B01L 9/00 (2006.01); B01L 3/00 (2006.01); B23P 17/04 (2006.01);
U.S. Cl.
CPC ...
G01N 27/4473 (2013.01); B01L 3/502715 (2013.01); G01N 27/44743 (2013.01); B01L 3/50273 (2013.01); B01L 9/527 (2013.01); B01L 2200/027 (2013.01); B01L 2200/04 (2013.01); B01L 2200/10 (2013.01); B01L 2300/0645 (2013.01); B01L 2300/0861 (2013.01); B01L 2400/0421 (2013.01); Y10T 29/49826 (2015.01);
Abstract
Measurement device () for taking a liquid sample, comprising: a measurement portion () with a measurement surface (), for being in use contacted with the liquid surface and a plug portion () having a plurality of electrical contacts (), wherein the plug portion () is mountable to a socket () of a measurement evaluation apparatus ().
Staal, Steven. (2016). Test chip with plug for measuring the concentration of an analyte in a liquid, housing for test chip and socket for plug (U.S. Patent No. 9410924). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9410924
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile