The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2016

Filed:

Nov. 05, 2014
Applicants:

Tomoyasu Aizaki, Kanagawa, JP;

Satoshi Nakamura, Kanagawa, JP;

Inventors:

Tomoyasu Aizaki, Kanagawa, JP;

Satoshi Nakamura, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/60 (2006.01); H04N 1/387 (2006.01); H04N 1/50 (2006.01); H04N 1/64 (2006.01);
U.S. Cl.
CPC ...
H04N 1/603 (2013.01); H04N 1/387 (2013.01); H04N 1/50 (2013.01); H04N 1/6075 (2013.01); H04N 1/644 (2013.01); H04N 2201/0081 (2013.01); H04N 2201/0082 (2013.01); H04N 2201/0089 (2013.01);
Abstract

An image processing apparatus includes a parameter estimation unit that estimates a first parameter for aligning first output image data with original image data and a second parameter for aligning second output image data with the original image data, a pixel value mapping unit that generates first pixel value mapping data associating color components of a pixel of the first output image data with color components of a corresponding pixel of the original image data and second pixel value mapping data associating color components of a pixel of the second output image data with color components of a corresponding pixel of the original image data, a map estimation unit that obtains a first map and a second map based on the first and second pixel value mapping data, and a conversion unit that converts a pixel value of the original image data based on the first and second maps.


Find Patent Forward Citations

Loading…