The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2016

Filed:

Apr. 09, 2015
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Bharathi Rahuldev Holla, Bangalore, IN;

Jagdish Chand Goyal, Bangalore, IN;

Biman Chattopadhyay, Bangalore, IN;

Sujoy Chakravarty, Bangalore, IN;

Sumantra Seth, Bangalore, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
H04L 7/0016 (2013.01);
Abstract

A clock and data recovery module (CDR) is configured to perform fast locking using only two samples per each unit interval (UI). Two clock phase signals are selected from a plurality of clock phase signals. A sequence of data bits is sampled at a rate of two times per UI responsive to the two clock phase signals in which a first sample of each UI is designated as an edge sample a second sample is designated as a data sample. Each edge sample is voted as early/late as compared to an associated data transition of the sequence of data bits by comparing each edge sample to a next data sample. The sample clocks are locked such that edge samples occur in proximity to data transitions by iteratively adjusting a phase of the two selected clock phase signals by a variable step size in response to the early/late vote.


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