The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Feb. 27, 2012
Joerg Schaffer, Goettingen, DE;
Peter Schnuell, Gleichen, DE;
Joerg Schaffer, Goettingen, DE;
Peter Schnuell, Gleichen, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
The invention relates to an optical assembly that can be interposed into the observation beam path of a microscope, comprising a first mount. In the first mount, a stack of optical elements for a polarization optical, differential interference contrast method, is arranged to facilitate a first observation method. The stack comprises, inter alia, a polarizer, polarization-optical shearing elements, and an analyzer. The analyzer is arranged in the stack with regard to its polarization direction in a predetermined orientation relative to the polarization direction of the polarizer. The stack of optical elements in the first mount is arranged such as to be interchangeable. Further, the assembly comprises at least one additional mount for receiving optical elements for at least one additional observation method.