The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Aug. 17, 2015
Applicant:
Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;
Inventors:
Sandeep Kumar Goel, Dublin, CA (US);
Ashok Mehta, Los Gatos, CA (US);
Assignee:
Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G01R 31/3177 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/318513 (2013.01); G01R 31/318563 (2013.01);
Abstract
A monolithic stacked integrated circuit (IC) is provided with a known-good-layer (KGL) test circuit. The KGL test circuit includes a scan segment, and a plurality of inputs, outputs, and multiplexers coupled to the scan segment. The KGL test circuit further includes a plurality of control elements such that scan testing of the stacked IC may be conducted on a layer-by-layer basis.