The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Sep. 12, 2012
York Oberdoerfer, North Rhine-Westphalia, DE;
York Oberdoerfer, North Rhine-Westphalia, DE;
GE Sensing & Inspection Technologies GMBH, Hurth, DE;
Abstract
Method and apparatus for the non-destructive inspection of a test object with a large material thickness by means of ultrasound. The apparatus includes an ultrasonic test probe with an ultrasonic transducer divided into a plurality of individually activatable transducer segments wherein the transducer segments are concentric circles or rings, or sections thereof. A first group j (j=1, 2, 3, . . . ) of transducer segments is selected in such a way that a parallel activation of these transducer segments results in a circular active surface Fj of the ultrasonic transducer (). An ultrasound inspection of the test object is undertaken with the first group j (j=1, 2, 3, . . . ) of transducer segments, wherein they are activated in parallel.