The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2016

Filed:

Jun. 24, 2014
Applicant:

Board of Trustees of the University of Illinois, Urbana, IL (US);

Inventors:

Gabriel Popescu, Champaign, IL (US);

Lynford L. Goddard, Champaign, IL (US);

Paul Scott Carney, Champaign, IL (US);

Taewoo Kim, Urbana, IL (US);

Renjie Zhou, Urbana, IL (US);

Mustafa A. H. Mir, Oakland, CA (US);

S. Derin Babacan, San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G01N 21/45 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); G01N 21/4795 (2013.01); G01N 21/453 (2013.01);
Abstract

Methods for obtaining a tomographic phase image of a specimen, either in transmission or in scatter. A specimen is illuminated by a temporally incoherent source and light collected in transmission or scattering is used to generate a scattered phase image of the specimen in multiple axial planes. The scattered field is solved for in wavevector space, and a derived instrument function is deconvolved to obtain specimen susceptibility in wavevector space. The specimen susceptibility is transformed to obtain a three-dimensional phase tomogram of the specimen.


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