The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2016

Filed:

Jun. 28, 2015
Applicant:

Winbond Electronics Corporation, Zhubei, TW;

Inventors:

Nir Tasher, Tel Mond, IL;

Valery Teper, Petach Tikva, IL;

Leonid Azriel, Haifa, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/00 (2006.01); H03K 19/003 (2006.01); G01R 31/28 (2006.01); G01R 31/317 (2006.01); G06K 19/073 (2006.01); H03K 3/037 (2006.01);
U.S. Cl.
CPC ...
H03K 19/003 (2013.01); G01R 31/2843 (2013.01); G01R 31/31719 (2013.01); G06K 19/07309 (2013.01); H03K 3/037 (2013.01); H03K 3/0375 (2013.01);
Abstract

An Integrated Circuit (IC) includes signal distribution circuitry and protection circuitry. The signal distribution circuitry is configured to distribute a high-fanout signal across the IC. The protection circuitry includes a plurality of logic stages and detection circuitry. The logic stages are configured to receive multiple instances of the signal that are sampled at multiple sampling points in the signal distribution circuitry. The logic stages are interconnected to drive one another in accordance with a given topology so as to propagate abnormalities indicative of faults occurring in the signal distribution circuitry. The detection circuitry is configured to detect a fault in the signal distribution circuitry in response to an abnormality propagating in the plurality of logic stages.


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