The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2016
Filed:
Mar. 13, 2015
Jeol Ltd., Tokyo, JP;
Takaki Ishikawa, Tokyo, JP;
JEOL Ltd., Tokyo, JP;
Abstract
A transmission electron microscope () includes an electron beam source (), an illumination lens system (), an objective lens (), a projector lens (), an imager () for capturing the TEM image projected by the projector lens (), a display controller () for causing the TEM image captured by the imager () to be displayed at a given size reduction percentage on a display device (), and a control unit () for controlling the objective lens (). The control unit () controls the amount of underfocus of the objective lens () on the basis of the size reduction percentage to display an edge enhanced image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile