The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9391617 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 12, 2016

Filed:

May. 08, 2013
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Sanu K. Mathew, Hillsboro, OR (US);

Rachael J. Parker, Forest Grove, OR (US);

Ram K. Krishnamurthy, Portland, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 19/003 (2006.01);
U.S. Cl.
CPC ...
H03K 19/00369 (2013.01); H03K 19/00315 (2013.01);
Abstract

An IC cell designed to assert one of multiple possible output states, each with equal probability, implemented to assert a pre-determined one of the multiple output states based on random variations within the IC cell, such as random process variations. An array of IC cells is configurable to provide a hardware-embedded key upon power-up that is unique to the combination of random variations of selected IC cells, resistant to tampering prior to and during manufacture, and tolerant to aging, instantaneous thermal noise, and environmental variations, such as voltage and temperature fluctuations. The key may be used as, without limitation, a Platform Root Key, a High-Bandwidth Digital Content Protection (HDCP) key, an Enhanced Privacy Identification (EPID) key, and/or an Advanced Access Content System (AACS) key. Also disclosed are techniques to measure stability and stress-harden an IC cell based on output states of the IC cell.


Find Patent Forward Citations

Mathew, Sanu. (2016). Hardware-embedded key based on random variations of a stress-hardened inegrated circuit (U.S. Patent No. 9391617). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9391617

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