The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Oct. 09, 2013
Carl Zeiss Microscopy Gmbh, Jena, DE;
Ingo Kleppe, Jena, DE;
Mirko Liedtke, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
The invention relates to a method for operating a microscope in which excitation light is focused on, or beamed to, different points of a specimen, in which an intensity of the excitation light is point-specifically varied and in which an intensity of the light reflected by said specimen in at least one spectral range is measured point-specifically and quantitatively. The method according to the invention is characterized in that the intensity and/or a spectral composition of the excitation light beamed to a specific point of said specimen is automatically adjusted by a regulating device on the basis of information previously gained from measured data of said specimen concerning an estimated or actual intensity of the light reflected in the spectral range by said point such that an integral of the intensity of the light reflected in the spectral range by this point during a pixel dwell time is within a predefined value interval. The invention also relates to a microscope.