The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Aug. 28, 2010
Jakow Konradi, Erfurt, DE;
Daniel Schwedt, Jena, DE;
Enrico Geissler, Jena, DE;
Günter Rudolph, Jena, DE;
Hans-jürgen Dobschal, Kleinromstedt, DE;
Jakow Konradi, Erfurt, DE;
Daniel Schwedt, Jena, DE;
Enrico Geissler, Jena, DE;
Günter Rudolph, Jena, DE;
Hans-Jürgen Dobschal, Kleinromstedt, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
Laser scanning microscope or spectral detector having a detection beam path and first imaging optics which image spectrally dispersed sample light in a Fourier plane such that the individual spectral components of the sample light are spatially separated from one another therein. A micromirror arrangement is provided in this plane, and a spectrally selective change in direction of the detection beam is carried out by controlling the micromirrors, where a useful light component of the detection beam arrives on a detector. At least one second micromirror arrangement and a 1:1 imaging of the first micromirror arrangement in the second micromirror arrangement is provided. Alternatively, the same micromirror arrangement is passed at least twice, where, in the light path between the first pass and second pass, a spatial offset of the light beam of at least the first pass and second pass is generated on the micromirror arrangement by optical means.