The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2016

Filed:

Feb. 18, 2015
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Masayoshi Ishikawa, Tokyo, JP;

Hideaki Suzuki, Tokyo, JP;

Tomoaki Hiruta, Tokyo, JP;

Toshio Masuda, Tokyo, JP;

Ken Kikegawa, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G07C 5/08 (2006.01); B60K 35/00 (2006.01); G06Q 10/00 (2012.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G07C 5/0808 (2013.01); B60K 35/00 (2013.01); G05B 23/0281 (2013.01); G06Q 10/20 (2013.01);
Abstract

Selection of sensors requires the knowledge of individual sensors mounted on a target machine and the knowledge of mechanical features of the machine. In the past, experts having mechanical knowledge selected the sensors. The present invention involves analyzing sensor data at e of machine failure, extracting features from the sensor data regarding each failure cause, and comparing the extracted features so as to clarify the difference between the sensor data about the failure causes and present an operator with the clarified difference thereby to support sensor selection. The invention makes it possible to select more simply than before the sensors considered effective for classifying failure causes. For example, the sensors deemed effective for classifying failure causes without mechanical knowledge can be selected.


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