The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2016
Filed:
Dec. 03, 2013
Applicant:
Sunedison Semiconductor Limited (Uen201334164h), St. Peters, MO (US);
Inventor:
Benno Orschel, St. Louis, MO (US);
Assignee:
SunEdison Semiconductor Limited (UEN201334164H), Singapore, SG;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06K 9/00 (2006.01); G06T 7/00 (2006.01); G01B 9/02 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01B 9/0201 (2013.01); G01B 9/02084 (2013.01); G01N 21/88 (2013.01);
Abstract
A method for measuring phase shift to detect irregularities of a surface is described. Additionally, a system for measuring phase shift to detect irregularities of a surface is provided. Further, a non-transitory computer-readable storage medium having computer-executable instructions embodied thereon is described. The computer-executable instructions are for measuring phase shift to detect irregularities of a surface.