The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2016

Filed:

Aug. 08, 2014
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Renhu Shi, Gottingen, DE;

Matthias Gonschor, Gleichen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/02 (2006.01); G02B 9/14 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/02 (2013.01); G02B 9/14 (2013.01); G02B 27/0025 (2013.01); G02B 27/0062 (2013.01);
Abstract

A tube lens unit for microscopes with achromatically corrective effect for the use with objectives that image an object to infinity and that have achromatic residual errors. The tube lens unit includes of at least two lenses with the properties:<1.50 and<71<1.66 and<37,wherein nand nsignify the refractive index (n) at a wavelength of 546 nm for a positive and negative lens respectively, and vand vsignify the Abbe number (v) at a wavelength of 546 nm for a positive and negative lens respectively, and the beam paths are characterized by the conditions:|δ|<0.60 and |δ|<0.30,


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