The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2016
Filed:
Nov. 11, 2009
Kumiko Kamihara, Mito, JP;
Tomonori Mimura, Kasama, JP;
Kumiko Kamihara, Mito, JP;
Tomonori Mimura, Kasama, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
Abnormality causes are automatically identified during daily quality control, based on the focused consideration of complex uncertainty factors and, especially, of the causes of device-side abnormalities, the latter of which are often difficult to identify. The analyzer performance that affects measurement results can be estimated from analysis parameters and calibration results. Thus, uncertainty estimates are automatically calculated for each analysis item during quality control, and the estimates are compared with uncertainties obtained during actual QC sample measurement, thereby monitoring and evaluating the analyzer performance. Also, measurements are performed on QC samples of multiple concentrations that contain substances known to subject to particular influences such as those of the optical system, sample dispenser, and reagent dispenser, so that the causes of abnormalities can be identified. Uncertainty estimates calculated from the parameters set for the analysis items are compared with uncertainties obtained from the QC sample measurements.