The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2016

Filed:

Jul. 15, 2015
Applicant:

Mitutoyo Corporation, Kanagawa, JP;

Inventor:

Yutaka Miki, Kanagawa, JP;

Assignee:

MITUTOYO CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); G01J 4/00 (2006.01); G01N 21/00 (2006.01); G01B 11/28 (2006.01); G01B 11/30 (2006.01); G01B 5/18 (2006.01); G01G 7/00 (2006.01); G01B 11/02 (2006.01); G01B 11/08 (2006.01);
U.S. Cl.
CPC ...
G01B 11/02 (2013.01); G01B 11/08 (2013.01); G01B 2210/50 (2013.01);
Abstract

An outer dimension measuring apparatus includes a light source; an optical system focusing the light emitted from the light source onto an optical axis; a reflector reflecting the focused light; a detector detecting an intensity of the reflected light; and a calculator calculating an outer dimension of a measured object using a first focus position, a second focus position, and a position of the reflector on the optical axis, the first focus position lying on the optical axis where a peak in reflected light intensity is detected by the detector for light reflected by a first surface, and the second focus position lying on the optical axis where a peak in reflected light intensity is detected by the detector for light that has been reflected by the reflector and emitted at a second surface.


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