The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2016
Filed:
Apr. 28, 2010
Sample-test-device management server, sample test device, sample test system, and sample test method
Takashi Noguchi, Machida, JP;
Yoshiyuki Tajima, Fujisawa, JP;
Koji Kamoshida, Hitachinaka, JP;
Naomi Ishii, Mito, JP;
Takashi Noguchi, Machida, JP;
Yoshiyuki Tajima, Fujisawa, JP;
Koji Kamoshida, Hitachinaka, JP;
Naomi Ishii, Mito, JP;
HITACHI HIGH-TECHNOLOGIES CORPORATION, Tokyo, JP;
Abstract
There is provided a sample test system which can execute a prior process for a specific sample in consideration of priorities and process progresses of a plurality of samples processed in the sample test system. The sample test system includes a sample-test-device management server, when a specific-sample prior process request containing a specific sample ID and a prior-process-request level identification code is accepted from a sample access system, which selects a specific-sample prior-process-policy determination table based on the prior-process-request level identification code attached to the specific-sample prior process request, which determines a specific-sample prior process policy based on the specific-sample prior-process-policy determination table and a process state of the sample, which specifies a sample ID regarding the specific sample ID, and which transmits the specific-sample prior process policy to a sample-test-device group