The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Oct. 21, 2013
Globalfoundries U.s. 2 Llc, Hopewell Junction, NY (US);
Alan James Drake, Austin, TX (US);
Michael Stephen Floyd, Cedar Park, TX (US);
Pawel Owczarczyk, Highland, NY (US);
Gregory Scott Still, Raleigh, NC (US);
Marshall Dale Tiner, Elgin, TX (US);
Xiaobin Yuan, Carmel, NY (US);
GLOBALFOUNDRIES INC., Grand Cayman, KY;
Abstract
A critical path monitor (CPM) having a set of split paths is configured in an integrated circuit (IC) that includes a corresponding set of critical paths. A first and a second split path is configured with a first and a second simulated delay sections and fine delay sections, respectively. A delay of each of the first and second fine delay sections is adjustable in several steps. The delay of the first fine delay section is adjustable differently from the delay of the second fine delay section in response to a common operating condition change. Differently adjusting the delays of the first and the second fine delay sections causes an edge of a pulse to be synchronized between a first edge detector located after the first simulated delay section and a second edge detector located after the second simulated delay section.